Microscopy Microanalysis Microstructures

TEM observations of SiC-SiC materials with a carbon interphase after tests at high temperature

Jean Vicens, Marie-Hélène Rouillon, Pascal Fourvel, François Abbé, Moussa Gomina and Jean-Louis Chermant

Microsc. Microanal. Microstruct., 2 1 (1991) 75-85

DOI: 10.1051/mmm:019910020107500

Jean Vicens

Marie-Hélène Rouillon

Pascal Fourvel

François Abbé

Moussa Gomina

Jean-Louis Chermant

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