Microscopy Microanalysis Microstructures

Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces

Dror Sarid, Roland Coratger, François Ajustron and Jacques Beauvillain

Microsc. Microanal. Microstruct., 2 6 (1991) 649

DOI: 10.1051/mmm:0199100206064900

Dror Sarid

Roland Coratger

François Ajustron

Jacques Beauvillain

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