Microscopy Microanalysis Microstructures

Manufacturers' corner - Design and performance of the CM20 FEG field emission TEM

Max T. Otten, Peter M. Mul and Marc J. C. de Jong

Microsc. Microanal. Microstruct., 3 1 (1992) 83-92

DOI: 10.1051/mmm:019920030108300

Max T. Otten

Peter M. Mul

Marc J. C. de Jong

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