Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 3, Number 1, February 1992
|
|
|---|---|---|
| Page(s) | 83 - 92 | |
| DOI | https://doi.org/10.1051/mmm:019920030108300 | |
Microsc. Microanal. Microstruct. 3, 83-92 (1992)
DOI: 10.1051/mmm:019920030108300
Philips Electron Optics, Building AAE, 5600 MD Eindhoven, The Netherlands
PACS
0778 - Electron, positron, and ion microscopes; electron diffractometers.
7940 - Thermionic emission.
Key words
Scanning transmission electron microscopy -- Electron guns -- Thermionic electron emission -- Field emission electron microscopes -- Instrumentation -- High-resolution methods -- Nanodiffraction
© EDP Sciences 1992
DOI: 10.1051/mmm:019920030108300
Manufacturers' corner - Design and performance of the CM20 FEG field emission TEM
Max T. Otten, Peter M. Mul et Marc J. C. de JongPhilips Electron Optics, Building AAE, 5600 MD Eindhoven, The Netherlands
Without abstract
PACS
0778 - Electron, positron, and ion microscopes; electron diffractometers.
7940 - Thermionic emission.
Key words
Scanning transmission electron microscopy -- Electron guns -- Thermionic electron emission -- Field emission electron microscopes -- Instrumentation -- High-resolution methods -- Nanodiffraction
© EDP Sciences 1992
First page of the article
