Microscopy Microanalysis Microstructures

Characterization of the metal-semiconductor interface by ballistic electron emission microscopy

Roland Coratger, François Ajustron and Jacques Beauvillain

Microsc. Microanal. Microstruct., 5 1 (1994) 31-40

DOI: 10.1051/mmm:019940050103100

Roland Coratger

François Ajustron

Jacques Beauvillain

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