S.T.E.M. chemical submicron scale investigations by EELS in the field of materials science Marie-Claude Cheynet, Soizic Blais, Cyril Barioz and Dominique Duly Microsc. Microanal. Microstruct., 5 2 (1994) 91-103 DOI: 10.1051/mmm:019940050209100