Microscopy Microanalysis Microstructures

HREM Observations of Ion Bombardment-Induced Dislocation Loops in ZnO

Jean-Jacques Couderc, Jean-Jacques Demai, Guy Vanderschaeve and Alain Peigney

Microsc. Microanal. Microstruct., 6 2 (1995) 229-235

DOI: 10.1051/mmm:1995101

Jean-Jacques Couderc

Jean-Jacques Demai

Guy Vanderschaeve

Alain Peigney

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