Microscopy Microanalysis Microstructures

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Spatially resolved electron energy-loss near-edge structure analysis of a near Σ = 11 tilt boundary in sapphire

John Bruley

Microsc. Microanal. Microstruct., 4 1 (1993) 23-39

DOI: 10.1051/mmm:019930040102300

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John Bruley

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