Microscopy Microanalysis Microstructures

Analysis of EXELFS modulations in EELS above the K-shell of silicon at 1 MeV in the HVEM

Raj Kumar Garg, Alain Claverie and Gérard Balossier

Microsc. Microanal. Microstruct., 1 1 (1990) 55-67

DOI: 10.1051/mmm:019900010105500

Raj Kumar Garg

Alain Claverie

Gérard Balossier

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