Microscopy Microanalysis Microstructures

A characteristic fluorescence correction factor for use in electron probe microanalysis. I. Theory

Christian Schiebl, Hans-Jürgen August and Johann Wernisch

Microsc. Microanal. Microstruct., 2 4 (1991) 413-423

DOI: 10.1051/mmm:0199100204041300

Christian Schiebl

Hans-Jürgen August

Johann Wernisch

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