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Depth Profiles of Al/Mn/Si Multilayers

Chrystel Hombourger, Philippe Jonnard, Christiane Bonnelle, Eric Beauprez, Marc Spirckel, Béatrice Feltz, Dominique Boutard and Jean-Paul Gallien
Microsc. Microanal. Microstruct., 8 4-5 (1997) 287-300
DOI: 10.1051/mmm:1997122

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