Free Access
Editorial
| Issue |
Microsc. Microanal. Microstruct.
Volume 3, Number 1, February 1992
|
|
|---|---|---|
| Page(s) | III - IV | |
| DOI | https://doi.org/10.1051/mmm:01992003010R300 | |
Microsc. Microanal. Microstruct. 3, III-IV (1992)
DOI: 10.1051/mmm:01992003010R300
Laboratoire de Microscopie lonique, URA CNRS 808 Université de Rouen, Mont Saint Aignan, France
PACS
0778 - Electron, positron, and ion microscopes; electron diffractometers.
Key words
Field ion microscope -- Atom probe -- High-resolution methods -- Laboratory equipment
© EDP Sciences 1992
DOI: 10.1051/mmm:01992003010R300
Editorial
Didier BlavetteLaboratoire de Microscopie lonique, URA CNRS 808 Université de Rouen, Mont Saint Aignan, France
Without abstract
PACS
0778 - Electron, positron, and ion microscopes; electron diffractometers.
Key words
Field ion microscope -- Atom probe -- High-resolution methods -- Laboratory equipment
© EDP Sciences 1992
First page of the article
