Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 3, Number 6, December 1992
|
|
|---|---|---|
| Page(s) | 529 - 532 | |
| DOI | https://doi.org/10.1051/mmm:0199200306052900 | |
Microsc. Microanal. Microstruct. 3, 529-532 (1992)
DOI: 10.1051/mmm:0199200306052900
Institute of Metal Forming Casting & Welding, Warsaw University of Technology, ul.Narbutta 85, 02-524 Warsaw, Poland
0660E - Sample preparation (including design of sample holders).
0778 - Electron, positron, and ion microscopes; electron diffractometers.
8140 - Treatment of materials and its effects on microstructure and properties.
Key words
Specimen preparation -- TEM -- Material processing -- Electropolishing -- Ultrasonic cleaning -- Cast alloy -- Binary alloys -- Aluminium base alloys -- Silicon alloys -- Microstructure -- AlSi alloys -- Al Si
© EDP Sciences 1992
DOI: 10.1051/mmm:0199200306052900
The preparation of Al-Si cast alloys specimens for TEM observa tions
Mieczyslaw KaczorowskiInstitute of Metal Forming Casting & Welding, Warsaw University of Technology, ul.Narbutta 85, 02-524 Warsaw, Poland
Abstract
An original method for preparing thin foils from Al-Si cast alloys is described. This simple method consists of one - jet electropolishing accompanied with ultrasonic "cleaning". The aim of this ultrasonic bath is to remove eutectic Si precipitates forming a specific "skeleton" in the specimen. This framework hinders the process of polishing and makes TEM observations more difficult, especially when high angle tilting is used.
0660E - Sample preparation (including design of sample holders).
0778 - Electron, positron, and ion microscopes; electron diffractometers.
8140 - Treatment of materials and its effects on microstructure and properties.
Key words
Specimen preparation -- TEM -- Material processing -- Electropolishing -- Ultrasonic cleaning -- Cast alloy -- Binary alloys -- Aluminium base alloys -- Silicon alloys -- Microstructure -- AlSi alloys -- Al Si
© EDP Sciences 1992