Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 4, Number 1, February 1993
Page(s) 51 - 61
DOI https://doi.org/10.1051/mmm:019930040105100
Microsc. Microanal. Microstruct. 4, 51-61 (1993)
DOI: 10.1051/mmm:019930040105100

Comparison of different TEM sample preparation methods for YBa2Cu3O7-δ type materials

Hui Gu1, Marie-Odile Ruault2 et Eric Beriot2

1  Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France
2  Centre de Spectrométrie Nucléaire et Spectrométrie de Masse, IN2P3, Bâtiment 108, 91405 Campus Orsay, France


Abstract
Four different TEM specimen preparation methods, ultramicrotomy, powder suspension, ion-milling and electropolishing, have been described and compared for diverse YBa2Cu3O7-δ samples. Based on TEM observations, defects introduced by these preparation methods are shown. The advantages and disadvantages for each method are discussed.

PACS
6172D - Experimental determination of defects by diffraction and scattering.
7472B - Y-based cuprates.

Key words
Experimental study -- TEM -- High-Tc superconductors -- Sample preparation -- Ultramicrotomy -- Milling -- Ion beams -- Electropolishing -- Barium oxides -- Copper oxides -- Yttrium oxides -- Quaternary compounds -- Microstructure -- Structure of liquids -- Structure of solids -- Crystallography -- Condensed matter physics -- Materials science -- Physics -- Metrology -- Condensed state physics -- Inorganic compounds -- Transition element compounds


© EDP Sciences 1993