Microsc. Microanal. Microstruct. 8, 187-202 (1997)
DOI: 10.1051/mmm:1997114

Application of the Convergent Beam Imaging (CBIM) Technique to the Analysis of Crystal Defects

Jean-Paul Morniroli¹, Patrick Cordier¹, Éric Van Cappellen², Jin Min Zuo³ et John Spence<sup>3

1</sup>  LSPES, URA CNRS 234, Université de Lille I, 59655 Villeneuve d'Ascq Cedex, France
²  Philips Electron Optics B.V. Bldg AAE, Achtseweg Noord, PO Box 218, 5600 MD Eindhoven, Pays-Bas s
³  Department of Physics, Arizona State University, Tempe, AZ 85287, USA

Abstract
It is shown how the technique of Convergent Beam IMaging (CBIM), proposed by Humpreys et al. in 1988, can be useful for the analysis of crystal defects such as dislocations in Garnet. It is also shown how the original technique can be greatly improved by using an objective aperture, a very small spot size and an energy filter. With these experimental conditions, the quality of the CBIM patterns is nearly as good as the quality of LACBED patterns, with which they are compared.

PACS
6116D - Electron microscopy determinations of structures.
6170J - Etch pits, decoration, transmission electron microscopy and other direct observations of dislocations.

Key words
dislocations -- electron microscopy -- garnets -- convergent beam imaging technique -- CBIM technique -- crystal defects -- dislocations -- garnets -- objective aperture -- small spot size -- energy filter


© EDP Sciences 1997