Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 8, Number 4-5, August / October 1997
|
|
|---|---|---|
| Page(s) | 325 - 334 | |
| DOI | https://doi.org/10.1051/mmm:1997125 | |
Microsc. Microanal. Microstruct. 8, 325-334 (1997)
DOI: 10.1051/mmm:1997125
1 Laboratoire de Chimie Physique - Matière et Rayonnement, URA 176, Université Pierre et Marie Curie (Paris VI), 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
2 Structure et Réactivité des Systèmes Métal-Céramique, Université Aix-Marseille , Faculté des Sciences et Techniques de St-Jérôme, 13397 Marseille Cedex 20, France
6848 - Solid solid interfaces.
7870E - X ray emission threshold and fluorescence condensed matter.
6855 - Thin film growth, structure, and epitaxy.
Key words
buried layers -- copper -- interface structure -- magnesium compounds -- metallic thin films -- substrates -- X ray emission spectra -- Cu MgO interfaces -- atomic structure -- physicochemical interaction -- buried interfaces -- electron X ray emission spectroscopy -- native interfaces -- atomic arrangement -- substrate characteristics -- strong interactions -- weak interactions -- Cu MgO -- MgO -- Cu
© EDP Sciences 1997
DOI: 10.1051/mmm:1997125
Physicochemical Interaction and Atomic Structure at Cu-MgO Interfaces
Philippe Jonnard1, Chrystel Hombourger1, Françoise Vergand1, Christiane Bonnelle1, Alain Renou2, Albert Assaban2, Eveline Gillet2 et Marcel Gillet21 Laboratoire de Chimie Physique - Matière et Rayonnement, URA 176, Université Pierre et Marie Curie (Paris VI), 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
2 Structure et Réactivité des Systèmes Métal-Céramique, Université Aix-Marseille , Faculté des Sciences et Techniques de St-Jérôme, 13397 Marseille Cedex 20, France
Abstract
Physicochemical interactions at Cu-MgO buried interfaces are studied by electron X-ray emission spectroscopy and compared to results obtained for native interfaces. The atomic arrangement
is also determined. The role of the characteristics of the substrate is evidenced. Results suggest that weak or strong interactions can be present at the interfaces.
6848 - Solid solid interfaces.
7870E - X ray emission threshold and fluorescence condensed matter.
6855 - Thin film growth, structure, and epitaxy.
Key words
buried layers -- copper -- interface structure -- magnesium compounds -- metallic thin films -- substrates -- X ray emission spectra -- Cu MgO interfaces -- atomic structure -- physicochemical interaction -- buried interfaces -- electron X ray emission spectroscopy -- native interfaces -- atomic arrangement -- substrate characteristics -- strong interactions -- weak interactions -- Cu MgO -- MgO -- Cu
© EDP Sciences 1997