Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 8, Number 4-5, August / October 1997
|
|
|---|---|---|
| Page(s) | III - III | |
| DOI | https://doi.org/10.1051/mmm:0199700804-50R300 | |
Microsc. Microanal. Microstruct. 8, III-III (1997)
DOI: 10.1051/mmm:0199700804-50R300
GDR 1108 ,"Caractérisation des interfaces dans les multimatériaux"
PACS
8170J - Chemical composition analysis, chemical depth and dopant profiling.
6835 - Solid surfaces and solid-solid interfaces: Structure and energetics.
Key words
Concentration measurement -- Interface structure -- Mechanical properties -- Analysis method -- SIMS -- RBS -- Multilayers -- Editorial -- Research group
© EDP Sciences 1997
DOI: 10.1051/mmm:0199700804-50R300
Éditorial
Daniel DavidGDR 1108 ,"Caractérisation des interfaces dans les multimatériaux"
Without abstract
PACS
8170J - Chemical composition analysis, chemical depth and dopant profiling.
6835 - Solid surfaces and solid-solid interfaces: Structure and energetics.
Key words
Concentration measurement -- Interface structure -- Mechanical properties -- Analysis method -- SIMS -- RBS -- Multilayers -- Editorial -- Research group
© EDP Sciences 1997
First page of the article
