Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 1, Number 2, April 1990
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|---|---|---|
| Page(s) | 127 - 140 | |
| DOI | https://doi.org/10.1051/mmm:0199000102012700 | |
References of Microsc. Microanal. Microstruct. 1 127-140
- Tixier R., Ph. D., Thesis Université Paris-Sud (1973) Série A, n° 196.
- Philibert J. and Tixier R., in Physical Aspects of Electron Microscopy and Microbeam Analysis, Eds. B. Siegel and D. Beaman (J. Wiley and Sons) 1975, p. 333.
- Statham P.J., J. Microsc. 123 (1981) 1.
- Nockolds C., Nasir M.J., Cliff G. and Lorimer G.W., Inst. Phys. Conf. Series 52 (1980) 417.
- Van Cappellen E., Ph.D. Thesis, University of Antwerp, UIA, Belgium (1986).
- Heinrich K.F.J., Adv. X-ray Anal. 11 (1968) 40.
- Stenton N., Notis M.R., Goldstein J.I. and Williams D.B., in Quantitative Microanalysis with high spatial resolution (The Metals Society, London) 1981, p. 35.
- Van Cappellen E., Deblieck R., Van Landuyt J. and ADAMS E, J. Trace Microprobe techniques 2 (1984) 139.
- Van Cappellen E., Microsc. Microanal. Microstruct. 1 (1990) 1. [CrossRef]