Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 1, Number 3, June 1990
Page(s) 199 - 213
DOI https://doi.org/10.1051/mmm:0199000103019900
References of Microsc. Microanal. Microstruct. 1 199-213
  • Colliex C., Cosslett V.E., Leapman R.D. and Trebbia P., Ultramicroscopy 1 (1976) 301 . [CrossRef] [PubMed]
  • Csillag S., Ph.D., Thesis-Stockholm, 1980.
  • Teo B.-K. and Lee P.A., J. Am. Chem. Soc. 101 (1979) 2815. [CrossRef]
  • Csillag S., Johnson D.E. and Stern E.A., Extended Energy Loss Fine Structure studies in an electron microscope, In: EXAFS-spectroscopy, Eds. Teo and Joy, pp. 241-254.
  • Egerton R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope, pp. 279-281.
  • Egerton R.F. and Crozier P.A., Scanning Microsc. Suppl. 2 (1988) 245.
  • Lee P.A. and Beni G., Phy. Rev. B15 (1977) 2862.
  • Baxter D.V., The Selection of E0 for EXELFS Spectra of Disordered Systems. EXAFS and Near Edge Structure III, Ed. K.O., Hodgsen, B. Hedman, and J.E., Penner-Hahn (Springer-Verlag) pp. 77-79.
  • Bourdillon A.J., El Mashri S.M. and Forty A.J., Philos. Mag. 49 (1984) 341.
  • Disko M.M., Krivanek O.L. and Rez P., Pliys. Rev . B25 (1982) 4252.