Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 3, Number 6, December 1992
Page(s) 501 - 516
DOI https://doi.org/10.1051/mmm:0199200306050100
References of Microsc. Microanal. Microstruct. 3 501-516
  • for a review, see for example Kittler M. and Seifert W. , Beam Injection Assessment of Defects in Semiconductors, Meudon-Bellevue, 1988, Rev. Phys. Appl. C6 (1989 ) 31.
  • Hergert W. , Reck P. , Pasemann L. , Schreiber J. , Phys. Stat. Sol. (a)101 (1987) 611. [CrossRef]
  • Hergert W. , Hildebrandt S. and Pasemann L. , Phys. Stat. Sol. (a)102 (1987) 819. [CrossRef]
  • Hildebrandt S. , Schreiber J. , Hergert W. and Petrov V.I. , Phys. Stat. Sol. (a)110 (1988) 283. [CrossRef]
  • Koch F. , Hergert W. , Oelgart G. and Puhlmann N. , Phys. Stat. Sol. ( a)109 (1988) 261. [CrossRef]
  • Achour S. , Phil. Mag. Lett. 59 ( 1989) 205. [CrossRef]
  • Puhlmann N. and Oelgart G. , Phys. Stat. Sol. (a)122 (1990 ) 705. [CrossRef]
  • Wu C.J. and Wittry D.B. , J. Appl. Phys. 49 (1978) 2827. [CrossRef]
  • Frigeri C. , Microscopy of Semiconducting Materials, Oxford 1987, Inst. Phys. Conf. Ser. 87 (1987) 745.
  • Sieber B. and Carton P. , Phys. Stat. Sol. (a)127 (1991 ) 423. [CrossRef]
  • Konnikov S.G. et aL, Soviet Phys. Semicond. 20 (1986) 661.
  • De Meerschman Ch. , Sieber B., Farvacque J.L. and Druelle Y. , part I of this paper.
  • Akamatsu B. , Henoc P. and Martins R.B. , J. Microsc. Spectrosc. Electron 14 ( 1989) 12.
  • Gruen A.E. , Z. Naturforsh. 12A (1957) 89.