Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 6, Number 3, June 1995
Page(s) 253 - 262
DOI https://doi.org/10.1051/mmm:1995122
References of Microsc. Microanal. Microstruct. 6 253-262
  • Auger P., C.R. Acad. Sci. Paris 177 (1923) 169.
  • Wilson C.T.R., Proc. Roy. Soc. LXXXVII (1912).
  • Ellis C.D., Proc. Roy. Soc. 99 (1921) 261. [CrossRef]
  • Meitner L., Z. Phys. 17 (1923) 54. [CrossRef]
  • Auger P., C.R. Acad. Sci. Paris 180 (1925) 65.
  • Auger P., Thèse présentée à la Faculté des Sciences de Paris, le 26 juin 1926, devant la Commission d'Examen composée de Mme Marie Curie, présidente, MM Georges Urbain et Jean Perrin, examinateurs, published in Ann. Phys. 6 (1926) 183.
  • Holweck F., Ann. Phys. 9ème série XVII 5 (1922).
  • Wentzel G., Z. Phys. 43 (1927) 524. [CrossRef]
  • Coster D. and R. de Kronig L., Physica 2 (1935) 13. [CrossRef]
  • Howarth L.J., Phys. Rev. 48 (1935) 88. [CrossRef]
  • Kiang, Ma and Wu, Phys. Rev. 50 (1936) 673. [CrossRef]
  • Massey H.S.W. and Burhop E.H.S., Electronic and Ionic Impact Phenomena (Oxford, 1952).
  • Briant J-P., Le Vide, Les Couches Minces 271 (1994) 127.
  • Bloch F., Phys. Rev. 48 (1935) 187. [CrossRef]
  • see Åberg T., Phys. Rev. A 4 (1971) 1735 and references therein. [CrossRef]
  • Meyer F.W., Griffin D.C., Havener C.C., Huq M.S., Phaneuf R.A., Swenson J.K. and Stolterfoht N., Phys. Rev. Lett. 60 (1988) 1821. [CrossRef] [PubMed]
  • Briand J.-P., de Billy L., Charles P., Essabaa S., Briand P., Geller R., Desclaux J-P., Bliman S. and Ristori C., Phys. Rev. Lett. 65 (1990) 159. [CrossRef] [PubMed]
  • Schuch R., Schneider D., Knapp D.A., DeWitt D., McDonald J., Chen M.H., Clark M.W. and Marrs R.E., Phys. Rev. Lett. 70 (1993) 1073. [CrossRef] [PubMed]
  • Massey H.S.W. and Bates D.R., Rep. Prog. Phys. 9 (1942) 62. [CrossRef]
  • Briand J-P., Charles R., Arianer J., Laurent H., Goldstein C., Dubau J., Loulergue M. and Bely-Dubau F., Phys. Rev. Lett 52 (1984) 617. [CrossRef]
  • Lander J.J., Phys. Rev. 91 (1953) 1382. [CrossRef]
  • Harrower G.A., Phys. Rev. 102 (1956) 340. [CrossRef]
  • Powell C.J., Robins J.L. and Swan J.B., Phys. Rev. 110 (1958) 657. [CrossRef]
  • Harris L.A., J. Appl. Phys. 39 (1968) 1419 and 1428. [CrossRef]
  • Weber R.E. and Peria W.T., J. Appl. Phys. 38 (1967) 4355. [CrossRef]
  • Palmberg P.W., Bohm G.K. and Tracy J.C., Appl. Phys. Lett. 15 (1969) 254. [CrossRef]
  • Steinhardt R.G. and Serfass E.J., Anal. Chem. 25 (1953) 697. [CrossRef]
  • Siegbahn K., Nordling C.N., Fahlman A., Nordberg R., Hamrin K., Hedman J., Johansson G., Benmark T., Karlsson S.E., Lindgren I. and Lindberg B. in ESCA: Atomic Molecular and Solid State Structure Studied by Means of Electron Spectroscopy, Almquist and Wiksells (Uppsala, 1967).
  • Seah M.P. and Dench W.A., Surf. Interface Anal. 1 (1979) 2. [CrossRef]
  • Tanuma S., Powell C.J. and Penn D.R., Surf. Interface Anal. 17 (1991) 911;  [CrossRef]20 (1993) 77. [CrossRef]
  • Powell C.J., Phys. Rev. Lett. 30 (1973) 1179. [CrossRef]
  • Cini M., Solid State Commun. 20 (1976) 605. [CrossRef]
  • Sawatzky G.A., Phys. Rev. Lett. 39 (1977) 504. [CrossRef]
  • Weightman P., Rep. Prog. Phys. 45 (1982) 753. [CrossRef]
  • Tréglia G., Desjonquères M-C., Ducastelle F. and Spanjaard D., J. Phys. C: Solid State Phys. 14 (1981) 4347. [CrossRef]
  • Haak H.W., Sawatzky G. and Thomas T.D., Phys. Rev. Lett. 41 (1978) 1825. [CrossRef]
  • Powell C.J., Le Vide, Les Couches Minces 271 (1994) 127.
  • Powell C.J. and Seah M.P., J. Vac. Sci. Technol. A8 (1990) 735. [CrossRef]
  • Gibbs J.W., Trans. Conn. Acad. Sci. 3 (1875) 108.
  • Hofmann S., in Practical Surface Analysis 1, D. Briggs and M.P. Seah Eds. (John Wiley and Sons Ltd, Chichester, 1990).
  • McDonald N.C., Appl. Phys. Lett. 16 (1970) 76. [CrossRef]
  • D. Briggs and M.P. Seah, Practical Surface Analysis 1, Auger and X-ray Photoelectron Spectroscopy (John Wiley and Sons Ltd, Chichester, 1990).