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All issues Volume 6 / No 3 (June 1995)
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Microscopy Microanalysis Microstructures

Volume 6 / No 3 (June 1995)


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Pierre Auger (1899-1993) p. I

DOI: https://doi.org/10.1051/mmm:0199500603025000
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Foreword

Preface p. III

Jacques Cazaux and Jean-Paul Langeron
DOI: https://doi.org/10.1051/mmm:0199500603025200
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The Auger Effect p. 253

Marie-Geneviève Barthés-Labrousse
DOI: https://doi.org/10.1051/mmm:1995122
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The Development of Auger Spectroscopy as a Probe of Local Electronic Structure p. 263

Peter Weightman
DOI: https://doi.org/10.1051/mmm:1995123
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Microanalytical Imaging with Auger Electrons p. 289

Martin Prutton
DOI: https://doi.org/10.1051/mmm:1995121
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The Role of Auger Electron Spectroscopy in the Semiconductor Industry p. 321

Derek K. Skinner
DOI: https://doi.org/10.1051/mmm:1995124
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The Role of the Auger Mechanism in the Radiation Damage of Insulators p. 345

Jacques Cazaux
DOI: https://doi.org/10.1051/mmm:1995125
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Microscopy Microanalysis Microstructures

ISSN: 1154-2799
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