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Cited article:

Analysis of EXELFS modulations in EELS above the K-shell of silicon at 1 MeV in the HVEM

Raj Kumar Garg, Alain Claverie, Gérard Balossier

Microsc. Microanal. Microstruct., 1 1 (1990) 55-67

DOI: https://doi.org/10.1051/mmm:019900010105500

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