The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
Peter Schattschneider, Peter Jonas, Mathias Mändl
Microsc. Microanal. Microstruct., 2 2-3 (1991) 367-375
This article has been cited by the following article(s):
Transmission Electron Microscopy
Ludwig Reimer
Springer Series in Optical Sciences, Transmission Electron Microscopy 36 143 (1997)
DOI: 10.1007/978-3-662-14824-2_5
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Electron Compton scattering in a symmetric two-beam scattering geometry
Peter Jonas and Peter Schattschneider
Microscopy Microanalysis Microstructures 4 (1) 63 (1993)
DOI: 10.1051/mmm:019930040106300
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Asymmetries in electron Compton profiles of silicon — a coherence effect
Alfred Exner and Peter Schattschneider
Ultramicroscopy 65 (3-4) 131 (1996)
DOI: 10.1016/S0304-3991(96)00060-5
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Investigation of Electron Momentum Density in Carbon Nanotubes Using Transmission Electron Microscopy
Zhenbao Feng, Hefu Li, Zongliang Wang, Xiaoyan Zhang, Hengshuai Li, Haiquan Hu and Dangsheng Su
Microscopy and Microanalysis 25 (05) 1155 (2019)
DOI: 10.1017/S1431927619014879
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