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Microscopy Microanalysis Microstructures 4 (1) 63 (1993)
DOI: 10.1051/mmm:019930040106300
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Asymmetries in electron Compton profiles of silicon — a coherence effect

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Ultramicroscopy 65 (3-4) 131 (1996)
DOI: 10.1016/S0304-3991(96)00060-5
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Investigation of Electron Momentum Density in Carbon Nanotubes Using Transmission Electron Microscopy

Zhenbao Feng, Hefu Li, Zongliang Wang, Xiaoyan Zhang, Hengshuai Li, Haiquan Hu and Dangsheng Su
Microscopy and Microanalysis 25 (05) 1155 (2019)
DOI: 10.1017/S1431927619014879
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