Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 2, Number 2-3, April / June 1991
Page(s) 367 - 375
DOI https://doi.org/10.1051/mmm:0199100202-3036700
References of Microsc. Microanal. Microstruct. 2 367-375
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  • Schattschneider P. , Pongratz P. , Proc. 12. Werner Brandt Int. Conf. on the Penetration of Charged Particles in Matter, 35-60. 1989 ( San Sebastian, Spain).
  • Jonas P. , Schattschneider P. , Pongratz P. , Proc. XII. ICEM Seattle (1990).
  • Schattschneider P. , Hohenegger H. , Analytical Electron Microscopy - 1987, D.C. Joy Ed. ( San Francisco Press, 1987) 270-74.
  • Williams B.G. , Uppal M.K. , Brydson R.D. , Proc. R. Soc. Lond. A 409 (1987) 161-176.
  • Williams B.G. , Parkinson M.P. , Eckhardt C.J. , Thomas J.M. , Chem. Phys. Lett. 78 (1981) 434-438. [CrossRef]
  • Williams B.G. , Sparrow T.G. , Egerton R.F. , Proc. R. Soc. Lond. A 393 (1984) 409-422.
  • Vasudevan S. , Rayment T. , Williams B.G. , Holt R. , Proc. R. Soc. Lond. A 391 (1984) 109-124.
  • see for instance the proceedings of the NSF/CNRS Workshop on Electron Beam Induced Spectroscopies, Aussois 1988, and references therein.
  • Batson P. , Rev. Sci. Instrum. 59 (1988) 1132-8. [CrossRef]
  • Egerton R.F. , J. EL Microsc. Tech. 1 (1984) 37-52. [CrossRef]
  • Strauss M.G. , Naday I. , Sherman I.S. , Zaluzek N.J. , Ultramicroscopy 22 (1987) 117-24. [CrossRef]
  • Zaluzek N.J. , Strauss M.G. , in [9] pp. 190-95.
  • Egerton R.F. , EELS in the Electron Microscope ( New York: Plenum Press, 1986) pp. 357-361.
  • Krivanek O.L. , Ahn C.C. and Keeney R.B. , Ultramicroscopy 22 (1987) 103-116. [CrossRef]
  • Berger S.D. , Mcmullan D. , in [9] pp. 182-84.
  • Photometrics Ltd. CCD selection chart, May 1989 .
  • VG Microscopes technical specification ELS 6000P.
  • see, e.g., Schattschneider P. , Fundamentals of Inelastic Electron Scattering , 22 ff ( Wien, New York: Springer-Verlag , 1986).