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Cited article:

Microscope à double détection : STOM-AFM, principe et résultats

Fadi Baida, Chekib Mered, Daniel Courjon

Microsc. Microanal. Microstruct., 5 1 (1994) 19-29

DOI: https://doi.org/10.1051/mmm:019940050101900

This article has been cited by the following article(s):

Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope

R. Laddada, S. Benrezzak, P. M. Adam, et al.
The European Physical Journal Applied Physics 6 (2) 171 (1999)
DOI: 10.1051/epjap:1999168
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Chemical Microscopy

Peter M. Cooke
Analytical Chemistry 68 (12) 333 (1996)
DOI: 10.1021/a1960011t
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