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This article has been cited by the following article(s):

Fabrication of Nano-Tips by Carbon Contamination in a Scanning Electron Microscope for Use in Scanning Probe Microscopy and Field Emission

Massimo Antognozzi, Andrea Sentimenti and Ugo Valdrè
Microscopy Microanalysis Microstructures 8 (6) 355 (1997)
DOI: 10.1051/mmm:1997127
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Michael T. Postek, Ty J. Prosa, Brian P. Geiser, Dan Lawrence, David Olson and David J. Larson
9173 917307 (2014)
DOI: 10.1117/12.2062211
See this article