Articles citing this article

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Cited article:

The Cylindrical Envelope Projection Model Applied to SE Images of Curved Surfaces and Comparison with AFM Evaluations

Massimo Antognozzi, Ugo Valdrè

Microsc. Microanal. Microstruct., 6 5-6 (1995) 513-522

DOI: https://doi.org/10.1051/mmm:1995143

This article has been cited by the following article(s):

Michael T. Postek, Ty J. Prosa, Brian P. Geiser, Dan Lawrence, David Olson and David J. Larson
9173 917307 (2014)
https://doi.org/10.1117/12.2062211

Fabrication of Nano-Tips by Carbon Contamination in a Scanning Electron Microscope for Use in Scanning Probe Microscopy and Field Emission

Massimo Antognozzi, Andrea Sentimenti and Ugo Valdrè
Microscopy Microanalysis Microstructures 8 (6) 355 (1997)
https://doi.org/10.1051/mmm:1997127