Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 4, Number 2-3, April / June 1993
|
|
---|---|---|
Page(s) | 171 - 181 | |
DOI | https://doi.org/10.1051/mmm:0199300402-3017100 |
Microsc. Microanal. Microstruct. 4, 171-181 (1993)
DOI: 10.1051/mmm:0199300402-3017100
Department of Materials Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 227, Japan
6172F - Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.).
6220F - Deformation and plasticity (including yield, ductility, and superplasticity).
0778 - Electron, positron, and ion microscopes; electron diffractometers.
Key words
High-voltage electron microscopy -- In situ -- Mechanical properties -- Strain measurement -- Dislocation motion -- Dislocation structure -- Monocrystals -- Temperature effects -- Binary alloys -- Nickel base alloys -- Aluminium alloys -- Ni3Al -- Al Ni
© EDP Sciences 1993
DOI: 10.1051/mmm:0199300402-3017100
In situ deformation and description of mechanical behaviors in Ni3Al
K. Jumonji et A. SatoDepartment of Materials Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 227, Japan
Abstract
In situ deformation has been conducted in the H-1250S HVEM with particular interest in finding correspondence between microscopic and macroscopic characteristics in strengthening of Ni3Al. Among the various materials, Fe-Cr-Ni, Mo, Ni3 Al, Fe-Mn-Si, Cu-Fe and Cu-Ni-Sn examined in recent several years, discrepancy has been noted in the high temperature strengthening of Ni3Al in situ and bulk experiments. The serious structural differences found between the two types of experiments are compared and discussed in the light of the thin foil effect.
6172F - Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.).
6220F - Deformation and plasticity (including yield, ductility, and superplasticity).
0778 - Electron, positron, and ion microscopes; electron diffractometers.
Key words
High-voltage electron microscopy -- In situ -- Mechanical properties -- Strain measurement -- Dislocation motion -- Dislocation structure -- Monocrystals -- Temperature effects -- Binary alloys -- Nickel base alloys -- Aluminium alloys -- Ni3Al -- Al Ni
© EDP Sciences 1993