Microsc. Microanal. Microstruct. 4, 183-190 (1993)
DOI: 10.1051/mmm:0199300402-3018300

In situ straining experiments in weak-beam conditions

D. Caillard, A. Couret, G. Molenat et J. Crestou

CEMES-LOE/CNRS, 29 rue Jeanne Marvig, 31055 Toulouse Cedex, France

Abstract
In situ straining experiments are described in some typical situations where the resolution of weak-beam is needed. Surface effects are shown to be unimportant, although the foil thickness is less than those in the classical bright field conditions.

Résumé
Des expériences de déformation in situ sont décrites dans des situations typiques où la résolution du faisceau faible est nécessaire. Les effets de surface apparaissent peu importants, bien que l'épaisseur observée soit plus faible qu'en conditions classiques de champ clair.

PACS
6172F - Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.).
6172H - Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, EPR, NMR, etc.).
6220F - Deformation and plasticity (including yield, ductility, and superplasticity).
560778 - Electron, positron, and ion microscopes; electron diffractometers.

Key words
TEM -- In situ -- Strain measurement -- Mechanical properties -- Dislocation motion -- Creep -- Thin films -- Intermetallic compounds -- Nickel base alloys -- Aluminium alloys -- Ni3Al -- Al Ni


© EDP Sciences 1993