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Foreword
| Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 1, February 1995
|
|
|---|---|---|
| Page(s) | III - IV | |
| DOI | https://doi.org/10.1051/mmm:01995006010R300 | |
Microsc. Microanal. Microstruct. 6, III-IV (1995)
DOI: 10.1051/mmm:01995006010R300
PACS
7870D - X-ray absorption spectra.
0781 - Electron and ion spectrometers.
8280P - Electron spectroscopy (x-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.).
Key words
EEL spectroscopy -- Imagery -- Data acquisition systems -- Electron microscopy -- Microanalysis -- Quantitative chemical analysis -- Crystal morphology -- Crystal structure -- Chemical composition -- Symposium
© EDP Sciences 1995
DOI: 10.1051/mmm:01995006010R300
Foreword
Ondrej Krivanek et Pierre StadelmannWithout abstract
PACS
7870D - X-ray absorption spectra.
0781 - Electron and ion spectrometers.
8280P - Electron spectroscopy (x-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.).
Key words
EEL spectroscopy -- Imagery -- Data acquisition systems -- Electron microscopy -- Microanalysis -- Quantitative chemical analysis -- Crystal morphology -- Crystal structure -- Chemical composition -- Symposium
© EDP Sciences 1995
First page of the article
