Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
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Page(s) | 443 - 448 | |
DOI | https://doi.org/10.1051/mmm:1995134 |
Microsc. Microanal. Microstruct. 6, 443-448 (1995)
DOI: 10.1051/mmm:1995134
Department of Physics, University of Bristol, Bristol BS8 1TL, UK
6114F - Experimental electron diffraction and scattering.
6114D - Theories of electron diffraction and scattering.
Key words
electron diffraction -- gallium compounds -- III V semiconductors -- indium compounds -- atomic string potentials -- hexagonal [0001] zone axis patterns -- polytype identification -- growth faults -- convergent beam electron diffraction -- semiconductors -- GaS -- GaSe -- InSe
© EDP Sciences 1995
DOI: 10.1051/mmm:1995134
Atomic String Potentials and the Form of [0001] Zone Axis Patterns of GaS, GaSe and InSe
John W. SteedsDepartment of Physics, University of Bristol, Bristol BS8 1TL, UK
Abstract
The relationship between the form of hexagonal zone
axis patterns and the projected atomic potential is explored as
a method for polytype identification of GaS, GaSe and InSe. As
the various known polytypes of these materials project to give
unit cells with very different simple-string potentials this
relationship may be exploited by making use of previous related
work. It is found that this method is simple to apply and
consistent with the results of more conventional analyses based
on the symmetry of convergent beam electron diffraction
patterns. Growth faults could, however, cause ambiguities in the
method of analysis.
6114F - Experimental electron diffraction and scattering.
6114D - Theories of electron diffraction and scattering.
Key words
electron diffraction -- gallium compounds -- III V semiconductors -- indium compounds -- atomic string potentials -- hexagonal [0001] zone axis patterns -- polytype identification -- growth faults -- convergent beam electron diffraction -- semiconductors -- GaS -- GaSe -- InSe
© EDP Sciences 1995