Free Access Microstructural and Microanalytical Techniques in Materials Science p. I Aldo Armigliato and Lorenzo Vasanelli DOI: https://doi.org/10.1051/mmm:0199500605-60R100 PDF (96.35 KB)
Free Access Atomic String Potentials and the Form of [0001] Zone Axis Patterns of GaS, GaSe and InSe p. 443 John W. Steeds DOI: https://doi.org/10.1051/mmm:1995134 PDF (826.3 KB)References
Free Access Influence of Experimental Parameters on the Determination of Tetragonal Distortion in Heterostructures by LACBED p. 449 Aldo Armigliato, Roberto Balboni, Franco Corticelli and Stefano Frabboni DOI: https://doi.org/10.1051/mmm:1995135 PDF (1.028 MB)References
Free Access Convergent Beam Electron Diffraction Analysis of Strain in Multilayer Structures: A Kinematical Approach p. 457 Daniela Manno and Saverio Mongelli DOI: https://doi.org/10.1051/mmm:1995136 PDF (489.7 KB)References
Free Access Elastic Stress Relaxation in HRTEM Specimens of Strained Semiconductor Heterostructures and its Influence on the Image Contrast p. 465 Liberato De Caro, Antonino Giuffrida, Elvio Carlino and Leander Tapfer DOI: https://doi.org/10.1051/mmm:1995137 PDF (1.072 MB)References
Free Access Strain Relaxation of Si/Ge Multilayers Investigated by Transmission Electron Microscopy and High-Resolution X-Ray Diffractometry p. 473 Elvio Carlino, Cinzia Giannini, Leander Tapfer, Kurt A. Mäder and Hans von Känel DOI: https://doi.org/10.1051/mmm:1995138 PDF (1.813 MB)References
Free Access Lattice Electron Microscopy and Image Processing of Ion-Implanted and Laser-Annealed GaAs Structures p. 483 Gianfranco Vitali, Marco Rossi, Giuseppe Zollo, Cesare Pizzuto, Nikolai Pashov and Maria Kalitzova DOI: https://doi.org/10.1051/mmm:1995139 PDF (1.404 MB)References
Free Access Investigation of Strain Relaxation Mechanisms in InGaAs/GaAs Single Layer Films p. 491 Filippo Romanato, Antonio Vittorio Drigo, Laura Francesio, Paolo Franzosi, Laura Lazzarini, Giancarlo Salviati, Massimo Mazzer, Maria Rita Bruni and Maria Grazia Simeone DOI: https://doi.org/10.1051/mmm:1995140 PDF (872.7 KB)References
Free Access Resolution of Semiconductor Multilayers using Backscattered Electrons in Scanning Electron Microscopy p. 499 Donato Govoni, Pier Giorgio Merli, Andrea Migliori and Michele Nacucchi DOI: https://doi.org/10.1051/mmm:1995141 PDF (676.3 KB)References
Free Access Recent Developments of the RBS Technique for the Analysis of Semiconductor Nanostructures p. 505 Marina Berti, Antonio Vittorio Drigo and Giacomo Torzo DOI: https://doi.org/10.1051/mmm:1995142 PDF (770.8 KB)References
Free Access The Cylindrical Envelope Projection Model Applied to SE Images of Curved Surfaces and Comparison with AFM Evaluations p. 513 Massimo Antognozzi and Ugo Valdrè DOI: https://doi.org/10.1051/mmm:1995143 PDF (1.266 MB)References
Free Access On the Improvement of SIMS Technique by the Use of Molecular Ions p. 523 Cosimo Gerardi and Claudia Massaro DOI: https://doi.org/10.1051/mmm:1995144 PDF (846.0 KB)References
Free Access Microanalytical Characterization of Art-Work Materials: Spatially Resolved Techniques p. 533 Enrico Ciliberto, Ignazio Fragalà, Nunzio Antonio Mancini and Giuseppe Spoto DOI: https://doi.org/10.1051/mmm:1995145 PDF (1.428 MB)References
Free Access Polymorphism in the Charge-Transfer Complex p. 545 Antonella Ciccarese, Dore Augusto Clemente, Armando Marzotto and Cesare Pecile DOI: https://doi.org/10.1051/mmm:1995146 PDF (548.9 KB)References
Free Access Dopant Concentration Measurements by Scanning Force Microscopy via p-n Junctions Stray Fields p. 551 Jacopo Dallari and Ugo Valdrè DOI: https://doi.org/10.1051/mmm:1995147 PDF (1.232 MB)References
Free Access Application of One-Dimensional Analytical Models for the Interpretation of Observations of Superconducting Fluxons p. 559 Giulio Pozzi, John E. Bonevich, Ken Harada, Hiroto Kasai, Tsuyoshi Matsuda, Takaho Yoshida and Akira Tonomura DOI: https://doi.org/10.1051/mmm:1995148 PDF (1.313 MB)References
Free Access Preparative Method and Analysis by OM, SEM and EPMA of Porous, Brittle and Low Permeability Rocks and Materials: The Case of Pumices p. 573 Fabio Gamberini and Giovanni Valdrè DOI: https://doi.org/10.1051/mmm:1995149 PDF (2.364 MB)References
Free Access Local Chemistry at Interfaces and Boundaries: Ceramic and Electronic Composite Materials p. 587 R.W. Carpenter, J.S. Bow, M.J. Kim, K. Das Chowdhury and W. Braue DOI: https://doi.org/10.1051/mmm:1995102 PDF (2.080 MB)References
Free Access Electron Microscopy Investigation on the Effect of Plastic Deformation in the Alloying of the Immiscible System Cu-Fe p. 601 Massimo Angiolini, Francesco Cardellini, Marek Krasnowski, Giorgio Mazzone, Amella Montone and Marco Vittori-Antisari DOI: https://doi.org/10.1051/mmm:1995150 PDF (1009 KB)References
Free Access Microstructural and Microanalytical Characterization of Pd Clusters in ORMOCER Matrix p. 611 Massimo Catalano, Elvio Carlino, Maria Antonnella Tagliente, Antonio Licciulli and Leander Tapfer DOI: https://doi.org/10.1051/mmm:1995151 PDF (1.588 MB)References
Free Access Progress in the Characterization of Layered Structures by X-Ray Microanalysis p. 621 David G. Rickerby DOI: https://doi.org/10.1051/mmm:1995152 PDF (993.8 KB)References
Free Access TEM-EDS Characterization of Second Phases in Ferritic Steels p. 633 Susanna Matera and Ettore Anelli DOI: https://doi.org/10.1051/mmm:1995153 PDF (1.604 MB)References
Free Access Interpretation of Holographic Contour Maps of Reverse Biased p-n Junctions p. 647 Clara Capiluppi, Andrea Migliori and Giulio Pozzi DOI: https://doi.org/10.1051/mmm:1995154 PDF (1.151 MB)References
Free Access Resolution Limits in the Study of Cardiolipin Crystals by TEM, SAED and AFM p. 659 Giovanni Valdrè, Umberto Muscatello and Ugo Valdrè DOI: https://doi.org/10.1051/mmm:1995155 PDF (923.9 KB)References
Free Access Study of Image Contrast Effects and Field Trends in Magnetic Recording Media by Static Magnetic Force Microscopy p. 665 Stefano Pergolini and Ugo Valdrè DOI: https://doi.org/10.1051/mmm:1995156 PDF (1.153 MB)References
Free Access Nanocrystalline Al Investigated by Transmission Electron Microscope p. 673 Marilena Re, Marco Alvisi, Ennio Bonetti and Leander Tapfer DOI: https://doi.org/10.1051/mmm:1995157 PDF (1.803 MB)References
Free Access Microstructural Characterization of Thin Films Obtained by Laser Irradiation p. 685 Paolo Mengucci, Gianni Barucca, Renato Marzocchini and Gilberto Leggieri DOI: https://doi.org/10.1051/mmm:1995158 PDF (1.293 MB)References
Molecular Ions
Charge-Transfer Complex