Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 2, Number 1, February 1991
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Page(s) | 89 - 96 | |
DOI | https://doi.org/10.1051/mmm:019910020108900 |
References of Microsc. Microanal. Microstruct. 2 89-96
- Thompson Russell K.C. and Edington J.W. , Practical Electron Microscopy in Materials Science Monograph-5 Mac Millan, N.V Philips . Eindhoven (1977).
- Newcomb S.B. , Baxter C.S. and Bithell E.G. , Inst. Phys. Conf. Ser. 93 (1988) 43.
- Garulli A. , Armigliato A. and Fineti M. , Ultramicroscopy 26 (1988) 295. [CrossRef]
- Chew N.G. and Cullis A.G. , Ultramicroscopy 23 ( 1987) 175. [CrossRef]
- Romano A. , Vanhellemont J. , Bender H. and Morante J.R. , Ultramicroscopy 31 ( 1989) 183. [CrossRef]
- Bollinger L.D. , Solid State Technology January (1983) 99.
- Revell P.J. and Goldspink G.F. , Vacuum 34 (1984) 455. [CrossRef]
- Zalm P.C. , Vacuum 34 (1984 ) 787.
- Doughty G.F. , Thoms S. , Cheung R. , Wilkinson C.D.W. , IPAT-87, 6th International Conference "Ion & Plasma Assisted Techniques" , Brighton U.K. (May 1987), CEP Consultants 187, p. 284-9.
- Sigmund P. , Phys. Rev. 184 (1969) 383. [CrossRef]
- Kolfschoten A.W. , Haring R.A. , Haring A. and de Vries A.E. , Thin Solid Films 55 (1984) 3813.
- Dieleman J. , Thin Solid Films 86 ( 1981) 147. [CrossRef]
- Dieleman J. , Sanders F.H.W. , Kolfschoten A.W. , Zalm P.C. , de Vries A.E. and Haring A. , J. Vac. Sci. Technol. B3 ( 1985) 1384.
- Mitzutani T. , Dale C.J. , Chu W.K. and Mayer T.M. , Nucl. Inst. Meth. B718 (1985) 825.
- Bahrish E.L. , Vitkavage DJ. and Mayer T.M. , J. Appl. Phys. 57 (1985) 1336. [CrossRef]