Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 2, Number 2-3, April / June 1991
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| Page(s) | 333 - 350 | |
| DOI | https://doi.org/10.1051/mmm:0199100202-3033300 | |
References of Microsc. Microanal. Microstruct. 2 333-350
- Ourmazd A. , Taylor D.W. , Cunningham J. and Tu C.W. , Phys. Rev. Lett. 62 (1989) 933. [CrossRef] [PubMed]
- Hytch M.J. , Boothroyd C.B. , Ross F.M. , Bithel E.G. and Stobbs W.M. , Electron Microscopy and Analysis 1989, P.J. Goodhew and H.Y. Elder Eds., IOPCS no 98 (Institute of Physics, Bristol , 1989) p. 345.
- Stobbs W.M. and Ross F.M. , Evaluation of advanced semiconductor materials by electron microscopy , D. Cherns Ed., NATO ASI series physics 203 (Plenum, New York, 1989) p. 183.
- Ness J.N. , Stobbs W.M. and Page T.F. , Philos. Mag. A54 ( 1986) 679.
- Ozkaya D. , Shih W.C. , Newcomb S.B. and Stobbs W.M. , Electron Microscopy and Analysis, 1989, P.J. Goodhew and H.Y. Elder Eds., IOPCS no 98 (Institute of Physics, Bristol, 1989) p. 199.
- Ross F.M. , Gibson J.M. and Stobbs W.M. , MRS syp proc 159 (MRS, Pittsburg , 1989) p. 185.
- Ross F.M. , Britton E.G. and Stobbs W.M. , EMAG '87 Analytical Electron Microscopy, G.W. Lorimer Ed. (Institie of Metals, London, 1988) p. 205.
- Ross F.M. and Stobbs W.M. , Philos. Mag. A63 ( 1991) 37.
- Ross F.M. and Stobbs W.M. , Philos. Mag. A63 ( 1991) 1.
- Pennycook S.J. and Jesson D.E. , Phys. Rev. Lett. 64 (1990) 938. [CrossRef] [PubMed]
- Stobbs W.M. and Saxton W.O. , J. Microsc. 151 (1988) 171.
- Boothroyd C.B. and Stobbs W.M. , Ultramicrosc. 26 (1988) 361. [CrossRef]
- Boothroyd C.B. and Stobbs W.M. , Ultramicrosc. 31 (1989) 259. [CrossRef]
- Hytch M.J. and Stobbs W.M. , EUREM 88, P.J. Goodhew and H.G. Dickinson Eds., IOPCS no 93 (Institute of Physics, Bristol , 1988) p. 347.
- Howie A. , Proc. Royal Soc. (London) A271 (1963) 268. [CrossRef]
- Hashimoto H. , Ultramicrosc. 18 (1985) 19. [CrossRef]
- Stobbs S.H. and Stobbs W.M. , EMAG '87 Analytical Electron Microscopy, G.W Lorimer Ed. (Institite of Metals, London, 1988) p. 111.
- Reimer L. and Ross-Messemer M. , J. Microsc. 155 (1989) 169.
- Reimer L. and Ross-Messemer M. , J. Microsc. 159 (1990) 143.
- Bakenfelder A. , Fromm I. , Reimer L. and Rennekamp R. , J. Microsc. 159 (1990) 161.
- Cundy S.L. , Metherell A.J.F. and Whelan M.J. , J. Scient. Instrum. 43 (1966) 712. [CrossRef]
- Cundy S.L. , Metherell A.J.F. and Whelan M.J. , Philos. Mag. 15 (1967) 623. [CrossRef]
- Rose H. and Plies E. , Optik 40 (1974) 336.
- Shumman H. , Ultramicroscopy 5 (1980) 45. [CrossRef] [PubMed]
- Krivanek O.L. , Proc EMSA, G.W Bailey Ed. (Claitors, Baton Rouge, 1979) p. 530.
- Shuman H. , Chang C.-F. and Somlyo A.P. , Ultralicrosc. 19 (1986) 121. [CrossRef]
- Bourdillon A.J. , Stobbs W.M. , Page K. , Home R. , Wilson C. , Ambrose B. , Turner L.J. and Tebby G.P. , Electron Microscopy and Analysis 1985, G.J. Tatlock Ed., IPOCS no. 78 ( Adam Hilger, Bristol, 1985) p. 161.
- Gubbens A.J. and Krivanek O.L. , presented at Lake Tahoe Workshop on EELS, 17-22 August 1990, Take Tahoe, California, USA and O.L. Krivanek and C. Ahn , Proc XIth Int Cong on EM, Kyoto 1986, T. Imura, S. Maruse and T Suzuki Eds.(Japanese Society of Electron Microscopy, Tokyo , 1986 ) p. 519.
- Enge H.A. , Chapter 4.2 in "Focussing of Charged Particles" vol. II, A. Septier Ed. (Academic Press, New York, 1967).
- Egerton R.F. , Electron Energy Loss Spectroscopy in the Electron Microscope ( Plenum Press, New York, 1986).
- Taftø J. and Spence J.C.H. , Ultramicrosc. 9 (1982) 243. [CrossRef]
- Bithell E.G. , Donovan P.E. and Stobbs W.M. , Phil. Mag. 59A (1989) 63.
- Stobbs W.M. , Electron microscopy in materials science, E. Rüedl and U. Valdré Eds. (comm of Eur Comm, 1975) p. 594.
- Cockayne D.J.H. and McKenzie D.R. , EUREM 88, P.J. Goodhew and H.G. Dickinson Eds., IOPCS no 93 (Institute of Physics , Bristol, 1988) p. 17.
- Spence J.C.H. , Zuo J.M. and Hoier R. , Evaluation of Advanced semiconductor materials by electron microscopy D. Cherns Ed., NATOASI Series Phys. 203 (Plenum , New York, 1989) p. 101.
- Wang Z.L. and Cowley J.M. , Ultramicroscopy 23 (1987) 97. [CrossRef]
- Howie A. and Milne R.H. , Ultramicroscopy 18 (1985 ) 427. [CrossRef]