Microsc. Microanal. Microstruct. 2, 333-350 (1991)
DOI: 10.1051/mmm:0199100202-3033300

Approaches for energy loss and energy filtered imaging in TEM in relation to the materials problems to be solved

William Michael Stobbs et Christopher Brian Boothroyd

Department of Materials Science and Metallurgy, Cambridge University, Pembroke St., Cambridge CB2 3QZ, G.B.

Abstract
The requirements of an energy filtering system for a transmission electron microscope (TEM) are enumerated in relation to the nature of the problems that could be tackled in materials science, if an instrument of sufficient quality were available. Accordingly, we describe the principles for a design for such a system, as based on a π/2 spectrometer with additional imaging quadrupoles and lenses, in relation to the different classes of problems for which it would be used. We further describe in more detail the changes in the design of a magnetic sector which are required when it is to be used primarily for imaging rather than for spectroscopy.

PACS
6837L - Transmission electron microscopy (TEM) (including STEM, HRTEM, etc.).
0781 - Electron and ion spectrometers.

Key words
TEM -- EEL spectroscopy -- Filtering -- Image processing -- Materials science


© EDP Sciences 1991