Free Access Editorial Editorial p. I Louis Porte and Frank Salvan DOI: https://doi.org/10.1051/mmm:0199400504-60R100 PDF (123.1 KB)
Free Access The nanometer age: Challenge and chance p. 237 Heinrich Rohrer DOI: https://doi.org/10.1051/mmm:0199400504-6023700 PDF (1.395 MB)References
Free Access Time resolved observation of growth processes on Si-surfaces with STM p. 247 Ulrich Köhler DOI: https://doi.org/10.1051/mmm:0199400504-6024700 PDF (2.248 MB)References
Free Access Monte-Carlo Simulations of Si Etching: Comparison with in-situ STM images p. 257 Philippe Allongue and Jérôme Kasparian DOI: https://doi.org/10.1051/mmm:0199400504-6025700 PDF (1.144 MB)References
Free Access Periodic faceting of Au(4,3,3) observed by scanning tunneling microscopy p. 269 Farhad Pourmir, Sylvie Rousset, Sébastien Gauthier, Micheline Sotto and Jean Klein DOI: https://doi.org/10.1051/mmm:0199400504-6026900 PDF (1.397 MB)References
Free Access Formation of an iodine zig-zag chain c(2 × 4) reconstruction on the Ge(111) surface p. 277 Mats Göthelid, Magnus Björkqvist, Ulf O. Karlsson and S. Anders Flodström DOI: https://doi.org/10.1051/mmm:0199400504-6027700 PDF (702.1 KB)References
Free Access Soft oxidation of graphite studied by XPS and STM p. 283 Magali Phaner-Goutorbe, Alain Sartre and Louis Porte DOI: https://doi.org/10.1051/mmm:0199400504-6028300 PDF (1.154 MB)References
Free Access Structure of Si(111) surfaces etched in 40% NH4F: Influence of the doping p. 291 J.R. Roche, M. Ramonda, F. Thibaudau, Ph. Dumas, Ph. Mathiez, F. Salvan and P. Allongue DOI: https://doi.org/10.1051/mmm:0199400504-6029100 PDF (1.890 MB)References
Free Access Scanning tunneling microscopic study of passive film formed on austenitic stainless steels in ambient air and in chloride media p. 301 Jean Marc Olive and Vincent Vignal DOI: https://doi.org/10.1051/mmm:0199400504-6030100 PDF (1.607 MB)References
Free Access Microscopie à effet tunnel des surfaces de GaSe hétéroépitaxié sur Si p. 313 Guy Michel Guichar, Mohammed Said Belkaid, Marc Morand and Youri Koudinov DOI: https://doi.org/10.1051/mmm:0199400504-6031300 PDF (1.790 MB)References
Free Access Characterization of the adhesion force between avidin-functionalized AFM tips and biotinylated agarose beads p. 321 Markus Ludwig, Vincent T. Moy, Matthias Rief, Ernst-Ludwig Florin and Hermann E. Gaub DOI: https://doi.org/10.1051/mmm:0199400504-6032100 PDF (1.059 MB)References
Free Access Are electron and near-field microscopies complementary? p. 329 Etienne Delain, Eric Le Cam, Agnès Barbin-Arbogast and Alain Fourcade DOI: https://doi.org/10.1051/mmm:0199400504-6032900 PDF (1.779 MB)References
Free Access Scanning tunneling microscopy of monoclonal immunoglobulin G p. 341 Jean Thimonier, Jean-Paul Chauvin, Jacques Barbet and Jose Rocca-Serra DOI: https://doi.org/10.1051/mmm:0199400504-6034100 PDF (1.393 MB)References
Free Access The molecular structure of a dodecanol-graphite interface defects shov by STM: Imaging of pure 1-dodecanol and 1-dodecanol-1,8-octanediol adsorbed layers p. 351 Jean-Claude Poulin DOI: https://doi.org/10.1051/mmm:0199400504-6035100 PDF (2.252 MB)References
Free Access Comparison at the microscopic scale of mixed fatty acid-protein Langmuir-Blodgett films resulting from horizontal or vertical transfer p. 359 Stéphane Alexandre, Nicolas Dubreuil, Catherine Fiol, Jean-Jacques Malandain, Françoise Sommer and Jean-Marc Valleton DOI: https://doi.org/10.1051/mmm:0199400504-6035900 PDF (2.370 MB)References
Free Access SEM, ToF-SIMS and LFM morphological study of an heterogeneous polymeric surface p. 373 Bernard Nysten, Geert Verfaillie, Etienne Ferain, Roger Legras, Jean-Benoit Lhoest, Claude Poleunis and Patrick Bertrand DOI: https://doi.org/10.1051/mmm:0199400504-6037300 PDF (2.113 MB)References
Free Access Near-field magneto-optical microscopy p. 381 Viatcheslav I. Safarov, Vladimir A. Kosobukin, Claudine Hermann, Georges Lampel and Jacques Peretti DOI: https://doi.org/10.1051/mmm:0199400504-6038100 PDF (901.1 KB)References
Free Access Near field optical microscopy by local perturbation of a diffraction spot p. 389 Renaud Bachelot, Philippe Gleyzes and Albert Claude Boccara DOI: https://doi.org/10.1051/mmm:0199400504-6038900 PDF (1.147 MB)References
Free Access On the way to a multi-task near field optical microscope: Simultaneous STM/SNOM and PSTM imaging p. 399 Maria Garcia-Parajo, Jean Rosiu and Chen Yong DOI: https://doi.org/10.1051/mmm:0199400504-6039900 PDF (1.236 MB)References
Free Access Interférometrie haute résolution par microscopie optique en champ proche p. 409 Fadi Baida, Claudine Bainier and Daniel Courjon DOI: https://doi.org/10.1051/mmm:0199400504-6040900 PDF (1.509 MB)References
Free Access Microscopies de champ proche optique : application aux semiconducteurs p. 427 Jean Pierre Fillard, Michel Castagné and Christel Prioleau DOI: https://doi.org/10.1051/mmm:0199400504-6042700 PDF (811.5 KB)References
Free Access PSTM : An alternative to measure local variation of optical index p. 435 Dominique Barchiesi and Daniel Van Labeke DOI: https://doi.org/10.1051/mmm:0199400504-6043500 PDF (2.254 MB)References
Free Access Contact AFM on soft surfaces: Elasticity and friction effects p. 447 Christian Frétigny and Marie-Claire Boisset DOI: https://doi.org/10.1051/mmm:0199400504-6044700 PDF (1.077 MB)References
Free Access Theoretical analysis of tip-MgO(100) surface interactions p. 455 Eric Castanier and Claudine Noguera DOI: https://doi.org/10.1051/mmm:0199400504-6045500 PDF (1.233 MB)References
Free Access Electrostatic forces between a metallic tip and semiconductor surfaces p. 467 Sylvain Hudlet, Michel Saint Jean, Bernard Roulet, Jacques Berger and Claudine Guthmann DOI: https://doi.org/10.1051/mmm:0199400504-6046700 PDF (971.4 KB)References
Free Access A mathematical morphology approach to image formation and image restoration in scanning tunnelling and atomic force microscopies p. 477 Noël Bonnet, Samuel Dongmo, Philippe Vautrot and Michel Troyon DOI: https://doi.org/10.1051/mmm:0199400504-6047700 PDF (1.425 MB)References
Free Access Modelling the AFM tip effect for quantitative analysis of precipitate volume fraction in nickel-based superalloys p. 489 Michel Troyon, Alain Hazotte and Abderrahim Bourhettar DOI: https://doi.org/10.1051/mmm:0199400504-6048900 PDF (1.676 MB)References
Free Access Point source physics: Application to electron projection microscopy and holography p. 501 Roger Morin DOI: https://doi.org/10.1051/mmm:0199400504-6050100 PDF (880.4 KB)References
Free Access Design and implementation of a Kelvin microprobe for contact potential measurements at the submicron scale p. 509 Walid Nabhan, Alexandre Broniatowski, Gilles de Rosny and Bernard Equer DOI: https://doi.org/10.1051/mmm:0199400504-6050900 PDF (781.7 KB)References
Free Access Nano-écriture sur couche d'or p. 519 Chrystel Lebreton and Zhao Zhong Wang DOI: https://doi.org/10.1051/mmm:0199400504-6051900 PDF (3.020 MB)References
Free Access Scanning surface harmonic microscopy: Application to silicon and Langmuir-Blodgett films on silicon p. 535 Jean-Philippe Bourgoin, Matthew Bruce Johnson and Bruno Michel DOI: https://doi.org/10.1051/mmm:0199400504-6053500 PDF (1.072 MB)References
