Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 1, February 1995
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|---|---|---|
| Page(s) | 99 - 111 | |
| DOI | https://doi.org/10.1051/mmm:1995110 | |
References of Microsc. Microanal. Microstruct. 6 99-111
- Egerton R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum Press, New York, 1986).
- Howie A. and Walsh C., Microsc. Microanal. Microstruct. 2 (1991) 171-181. [CrossRef] [EDP Sciences]
- Brydson R., Sauer H., Engel W. and Zeitler E., Microsc. Microanal. Microstruct. 2 (1991) 159-169. [CrossRef] [EDP Sciences]
- Hofer F. and Golob P., Ultramicroscopy 21 (1987) 379-384. [CrossRef]
- Joy D.G. and Maher D.M., Ultramicroscopy 3 (1978) 69-74. [CrossRef]
- Schmid H.K., Proc. 13th ICEM, Paris (1994) 695-96.
- Berger S.D., McKenzie D.R. and Martin P.J., Phil. Mag. Lett. 57 (1988) 285-290. [CrossRef]
- Egerton R.F. and Whelan M.J., Phil. Mag. 30 (1974) 739-749. [CrossRef]
- Kurdyumov A.V., Ostrovskaya N.F. and Golubev A.S., Sverkhtverdye Mater. 6 [4] (1984) 17-25.
- Saito Y., Suzuki N., Shinohara H., Hayashi T. and Tomita M., Ultramicroscopy 41 (1992) 1-9. [CrossRef]
- Rosenberg R.A., Love P.J. and Rehn V., Phys. Rev. B 33 (1986) 4034.
- Kulik J., Lifshitz Y., Lempert G.D., Rotter S., Rabalais J.W. and Marton D., Proc. 50th Meeting Electr. Microsc. Soc. Am. (1992) 1272-73.
- Cuomo J.J., Doyle J.P., Bryley J. and Liu J.C., Appl. Phys. Lett. 58 (1991) 466-468. [CrossRef]
- Hosoi J., Oikawa T. and Inoue M., J. Electr. Spectr. Relat. Phenom. 27 (1982) 243-254. [CrossRef]
- Disko M.M., Krivanek O. and Spence J.C.H., Proc. 39th EMSA Conf. (1981) 192-93.
- Schmid H.K., Proc. Electr. Microsc. Soc. South. Afr. 23 (1993) 7-9, ibid. 78.
- McColm I.J., Ceramic Hardness (Plenum Press, NY, 1990) p. 209.
- Rapoport E., Ann. Chim. Fr. 10 (1985) 607-638.
- Diamond and Diamond-like Carbon Coatings: Gorham Adv. Mat. Inst., Vol. 1 (1989).
- Knight D.S. and White W.B., J. Mater. Res. 4 (1989) 385-393. [CrossRef]