Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
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Page(s) | 457 - 463 | |
DOI | https://doi.org/10.1051/mmm:1995136 |
References of Microsc. Microanal. Microstruct. 6 457-463
- Gibson J.M. and Treacy M.M.J., Ultramicrosc. 14 (1984) 345. [CrossRef]
- Xie, Fung K.K., York P.K., Fernandez G.E., Eades J.A. and Coleman J.J., Appl. Phys. Lett. 57 (1990) 1978. [CrossRef]
- Cherns, Touaitia, Preston A.R., Rossouw C.J. and Houghton D.C., Philos. Mag. A64 (1991) 397.
- Wang S.Q. and Peng L.M., Ultramicrosc. 55 (1994) 68.
- Gong H., C.D. and Schapink F.W., Ultramicrosc. 35 (1991) 171. [CrossRef]
- Hirsch P., Howie A., Nicholson R.P., Pasheley D.W., Whelan M.J., "Electron Microscopy of Thin Crystals" (Robert E. Krieger Publishing Company, Malabar, Florida, 1977).
- Stadelmann P., Ultramicrosc. 21 (1987) 131. [CrossRef]
- Manno D., Cingolani R., Sorba L., Vanzetti L., Franciosi A., "Convergent beam electron diffraction study of CdZnSe/ZnSe strained- layer superlattices", 9th International Conference on Microscopy of Semiconducting Materials (20-23 March 1995).