Free Access
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
Page(s) 457 - 463
Microsc. Microanal. Microstruct. 6, 457-463 (1995)
DOI: 10.1051/mmm:1995136

Convergent Beam Electron Diffraction Analysis of Strain in Multilayer Structures: A Kinematical Approach

Daniela Manno et Saverio Mongelli

Dipartimento di Scienza dei Materiali, Università di Lecce, Via Arnesano, 73100 Lecce, Italy

onvergent beam electron diffraction (CBED) performed on plan-view samples has been considered in order to analyse strained superlattices. The composition modulation along the growth axis of multilayer materials and the strain modulation at the interfaces give rise to special features in higher order Laue zone (HOLZ) reflections. A simple model based on the expansion-contraction of the lattice spacing in each layer along the growth direction is proposed to simulate rocking curves in the kinematical approximation. Applications to $\rm Cd_xZn_{1-x}Se/ZnSe$ superlattices are discussed.

6114D - Theories of electron diffraction and scattering.
6114F - Experimental electron diffraction and scattering.
6865 - Low dimensional structures: growth, structure and nonelectronic properties.
6220F - Deformation and plasticity.
8140L - Deformation, plasticity and creep.
6825 - Mechanical and acoustical properties of solid surfaces and interfaces.

Key words
cadmium compounds -- deformation -- electron diffraction -- II VI semiconductors -- semiconductor superlattices -- zinc compounds -- convergent beam electron diffraction -- multilayer structures -- strained superlattices -- plan view samples -- CBED -- composition modulation -- strain modulation -- higher order Laue zone reflections -- lattice spacing -- rocking curves -- kinematical approximation -- semiconductors -- CdZnSe ZnSe

© EDP Sciences 1995