Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 7, Number 1, February 1996
|
|
|---|---|---|
| Page(s) | 17 - 25 | |
| DOI | https://doi.org/10.1051/mmm:1996104 | |
References of Microsc. Microanal. Microstruct. 7 17-25
- Kautek W., Vacuum 43 (1992) 403. [CrossRef]
- Scheel H.J., Berkowski M. and Chabot B., J. Crystal Growth 115 (1991) 19. [CrossRef]
- Sidorov M.V., Oktyabrsky S. and Krasnosvobodtsev S.I., Mat. Sci. Eng. B18 (1993) 295. [CrossRef]
- Eibl O. and Roas B., J. Mater. Res. 5 (1990) 2620. [CrossRef]
- Ye M., Mehbod M. and Deltour R., Physica B 204 (1995) 200. [CrossRef]
- Mehbod M., Biberacher W., Jansen A.G.M., Wyder P., Deltour R. and Duvigneaud P.H., Phys. Rev. B 38 (1988) 11813.
- Tomé-Rosa C., Jacob G., Paulson M., Wagner P., Walkenhorst A., Schmitt M. and Adrian H., Phys C 185-189 (1991) 2175. [CrossRef]
- Bean C.P., Phys. Rev. Lett. 8 (1962) 250. [CrossRef]
- Catana A., Broom R.F., Bednorz J.G., Mannhart J. and Schlom D.G., Appl. Phys. Lett. 60 (1992) 1016. [CrossRef]
- Dorignac D., Schamm S., Grigis C., Sévely J., Santiso J. and Figueras A., Phys C 235-240 (1994) 617. [CrossRef]
- Lu P., Li Q., Zhao J., Chern C.S., Gallois B., Noris P., Kear B. and Cosandey F., Appl. Phys. Lett. 60 (1992) 1265. [CrossRef]
- Verbist K., Vasiliev A.L. and Van Tendeloo G., Appl. Phys. Lett. 66 (1995) 1424. [CrossRef]
- Zandbergen H.W., Gronsky R. and Thomas G., Phys. Stat. Sol. A 105 (1988) 207. [CrossRef]
- Matijasevic V., Rosenthal P., Shinohara K., Marshall A.F., Hammond R.H. and Beasley M.R., J. Mater. Res. 6 (1991) 682. [CrossRef]
- Chew N.G., Goodyear S.W., Edwards J.A., Satchell J.S., Blenkinsop S.E. and Humphreys R.G., Appl. Phys. Lett. 57 (1990) 2016. [CrossRef]
- Selinder T.I., Helmersson U. and Han Z., Thin Solid Films 229 (1993) 273.