Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
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|---|---|---|
| Page(s) | 533 - 543 | |
| DOI | https://doi.org/10.1051/mmm:1995145 | |
Microsc. Microanal. Microstruct. 6, 533-543 (1995)
DOI: 10.1051/mmm:1995145
1 Dipartimento di Scienze Chimiche, Università di Catania, V le A. Doria 6, 95125 Catania, Italy
2 Centro Universitario di Microscopia Elettronica CUMEC, Dipartimento di Fisica, Università di Catania, V le A. Doria 6, 95125 Catania, Italy
8170 - Methods of materials testing and analysis.
0778 - Electron, positron, and ion microscopes; electron diffractometers.
0775 - Mass spectrometers.
8280 - Chemical analysis and related physical methods of analysis.
Key words
Analysis method -- Chemical analysis -- Microanalysis -- Lateral resolution -- Depth resolution -- Electron spectrometry -- Mass spectrometry -- Scanning electron microscopy -- X ray spectrometry -- Auger electron spectrometry -- Cultural artefact -- Conservation -- Spectrometric methods -- Optical methods -- Analytical chemistry -- Chemistry
© EDP Sciences 1995
DOI: 10.1051/mmm:1995145
Microanalytical Characterization of Art-Work Materials: Spatially Resolved Techniques
Enrico Ciliberto1, Ignazio Fragalà1, Nunzio Antonio Mancini2 et Giuseppe Spoto11 Dipartimento di Scienze Chimiche, Università di Catania, V le A. Doria 6, 95125 Catania, Italy
2 Centro Universitario di Microscopia Elettronica CUMEC, Dipartimento di Fisica, Università di Catania, V le A. Doria 6, 95125 Catania, Italy
Abstract
This study presents the application of lateral (SEM/EDX, SAM, SIMS) and
vertical (SAM, XPS, SIMS) high resolution techniques on materials in
artwork of cultural heritage. Emphasis will be placed on how such techniques
are now indispensable in a science-based approach to the characterization of
materials and the rationalization of their degradation, this in itself being
essential for conservation and useful for a clearer understanding of the
artistic techniques used in the past.
8170 - Methods of materials testing and analysis.
0778 - Electron, positron, and ion microscopes; electron diffractometers.
0775 - Mass spectrometers.
8280 - Chemical analysis and related physical methods of analysis.
Key words
Analysis method -- Chemical analysis -- Microanalysis -- Lateral resolution -- Depth resolution -- Electron spectrometry -- Mass spectrometry -- Scanning electron microscopy -- X ray spectrometry -- Auger electron spectrometry -- Cultural artefact -- Conservation -- Spectrometric methods -- Optical methods -- Analytical chemistry -- Chemistry
© EDP Sciences 1995