Free Access
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
Page(s) 533 - 543
Microsc. Microanal. Microstruct. 6, 533-543 (1995)
DOI: 10.1051/mmm:1995145

Microanalytical Characterization of Art-Work Materials: Spatially Resolved Techniques

Enrico Ciliberto1, Ignazio Fragalà1, Nunzio Antonio Mancini2 et Giuseppe Spoto1

1  Dipartimento di Scienze Chimiche, Università di Catania, V le A. Doria 6, 95125 Catania, Italy
2  Centro Universitario di Microscopia Elettronica CUMEC, Dipartimento di Fisica, Università di Catania, V le A. Doria 6, 95125 Catania, Italy

This study presents the application of lateral (SEM/EDX, SAM, SIMS) and vertical (SAM, XPS, SIMS) high resolution techniques on materials in artwork of cultural heritage. Emphasis will be placed on how such techniques are now indispensable in a science-based approach to the characterization of materials and the rationalization of their degradation, this in itself being essential for conservation and useful for a clearer understanding of the artistic techniques used in the past.

8170 - Methods of materials testing and analysis.
0778 - Electron, positron, and ion microscopes; electron diffractometers.
0775 - Mass spectrometers.
8280 - Chemical analysis and related physical methods of analysis.

Key words
Analysis method -- Chemical analysis -- Microanalysis -- Lateral resolution -- Depth resolution -- Electron spectrometry -- Mass spectrometry -- Scanning electron microscopy -- X ray spectrometry -- Auger electron spectrometry -- Cultural artefact -- Conservation -- Spectrometric methods -- Optical methods -- Analytical chemistry -- Chemistry

© EDP Sciences 1995