Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 1, Number 3, June 1990
|
|
|---|---|---|
| Page(s) | 233 - 240 | |
| DOI | https://doi.org/10.1051/mmm:0199000103023300 | |
Microsc. Microanal. Microstruct. 1, 233-240 (1990)
DOI: 10.1051/mmm:0199000103023300
1 JEOL Ltd., 1-2 Musashino 3-chome Akishima Tokyo 196, Japan
2 JEOL S.A., 16, Avenue de Colmar, 92500 Rueil-Malmaison, France
PACS
0778 - Electron, positron, and ion microscopes; electron diffractometers.
Key words
Analytical electron microscopy -- High-resolution methods -- Instrumentation -- Optical lens -- Goniometers -- Vacuum systems
© EDP Sciences 1990
DOI: 10.1051/mmm:0199000103023300
Development of a 300 kV ultrahigh resolution analytical electron microscope
Yoshihiro Arai1, Kurio Fukushima1, Yasushi Kokubo1 et Alain Michot21 JEOL Ltd., 1-2 Musashino 3-chome Akishima Tokyo 196, Japan
2 JEOL S.A., 16, Avenue de Colmar, 92500 Rueil-Malmaison, France
Without abstract
PACS
0778 - Electron, positron, and ion microscopes; electron diffractometers.
Key words
Analytical electron microscopy -- High-resolution methods -- Instrumentation -- Optical lens -- Goniometers -- Vacuum systems
© EDP Sciences 1990
First page of the article
