Free Access STM Visualization of C84 Fullerene on Gold p. 363 Jean-Claude Poulin, Claude Fabre and André Rassat DOI: https://doi.org/10.1051/mmm:1995127 PDF (1.029 MB)References
Free Access Morphological Analysis of UO2 Powder using a Dead Leaves Model p. 371 Dominique Jeulin, Ivan Terol Villalobos and Alain Dubus DOI: https://doi.org/10.1051/mmm:1995126 PDF (1.904 MB)References
Free Access Report on the 1993 and 1994 Round Robin EDXS Tests of the Ile de France TEM Network p. 385 Danièle Bouchet and Jannick Ingrin DOI: https://doi.org/10.1051/mmm:1995128 PDF (773.4 KB)References
Free Access "Wet Technique" Metal Deposition for SEM Observation p. 393 Guy Stremsdoerfer, Jean-Marc Krafft, Eric Queau and Jean-René Martin DOI: https://doi.org/10.1051/mmm:1995129 PDF (3.822 MB)References
Free Access Quantitative Elemental Distribution Image of a Carbon Nanotube p. 405 Hiroki Kurata, Seiji Isoda and Takashi Kobayashi DOI: https://doi.org/10.1051/mmm:1995130 PDF (1.457 MB)References
Free Access Monte Carlo Calculation of the X-Ray Depth Distributions in an Aluminum Target p. 415 Khaled Raouadi and Zouheir Fakhfakh DOI: https://doi.org/10.1051/mmm:1995131 PDF (444.1 KB)References
Free Access EPMA Sputter Depth Profiling: A New Technique for Quantitative in-Depth Analysis of Layered Structures p. 421 Peter Karduck and Alexander von Richthofen DOI: https://doi.org/10.1051/mmm:1995132 PDF (1.476 MB)References
Free Access Direct Measurements of the Radiolytic Transformation of Thin Films of Titanium Dioxide using EELS p. 433 Peter Rez, Jon Karl Weiss, Douglas L. Medlin and David G. Howitt DOI: https://doi.org/10.1051/mmm:1995133 PDF (737.9 KB)References
Free Access Book reviews: Elastic and Inelastic Scattering in Electron Diffraction and Imaging Zhong Lin Wang Plenum Press, New York and London (1995) p. 441 Christian Colliex DOI: https://doi.org/10.1051/mmm:0199500604044100 PDF (294.5 KB)
