Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 2, Number 2-3, April / June 1991
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|---|---|---|
| Page(s) | 203 - 213 | |
| DOI | https://doi.org/10.1051/mmm:0199100202-3020300 | |
References of Microsc. Microanal. Microstruct. 2 203-213
- Egerton R.F. , Ultramicroscopy 3 (1978) 243. [CrossRef] [PubMed]
- Egerton R.F. , Ultramicroscopy 9 (1982) 387. [CrossRef]
- Bevington P.R. , Data Reduction and Error Analysis in the Physical Sciences (McGraw-Hill, New York , 1969) p. 105.
- Pun T. , Ellis J.R. and Eden M. , J. Microsc. 137 (1985) 93. [PubMed]
- Liu D.R. and Williams D.B. , Proc. 45th Ann. Meeting EMSA (1987) 118.
- Colliex C. , Jeanguillaume C. and Trebbia P. , Microprobe Analysis of Biological Systems, T.E. Hutchinson and A.P. Somlyo Eds. (Academic Press, New York, 1981) p. 251.
- De Bruijn W.C. and Sorber W.J. , Proc. XII Int. Cong. for Elec. Microsc. vol. 2 (San Francisco Press , 1990) p. 68.
- Bentley J. , Lehman G.L. and Sklad P.S. Analytical Electron Microscopy (San Francisco Press , 1981) p. 161.
- Kundmann M.K. , in Microbeam Analysis A.D. Romig and W.F. Chambers Eds. (San Francisco Press, 1986) p. 417.
- Steele J.D. , Titchmarsh J.M. , Chapman J.N. and Paterson J.H. , Ultramicroscopy 17 (1985) 273. [CrossRef]
- Leapman R.D. and Swyt C.R. , Ultramicroscopy 26 (1988) 393. [CrossRef] [PubMed]
- Shuman H. and Somlyo A.P. , Ultramicroscopy 21 (1987) 23. [CrossRef] [PubMed]
- Yang Y.Y. and Egerton R.F. , Proc. XIIth International Congress for Electron Microscopy ( San Francisco Press) vol. 2 ( 1990) p.48; research paper in preparation.
- Titchmarsh J.M. and Malis T.F. , Ultramicroscopy 28 (1989) 277. [CrossRef]
- Crozier P.A. , Philos. Mag. B 61 (1990) 311.
- Johnson D.E. , Ultramicroscopy 5 (1980) 163 [CrossRef]; Egerton R.F. , Ultramicroscopy 3 (1978 ) 39. [CrossRef]
- Egerton R.F. , Electron Energy-Loss Spectroscopy in the Electron Microscope ( Plenum, New York, 1986).
- Leapman R.D. , Proc. 47th Annual Meeting Electron Microsc. Soc. America ( San Francisco Press, 1989) p. 400.
- Stephens A.P. , Ultramicroscopy 5 (1980) 343. [CrossRef]
- Egerton R.F. , Ultramicroscopy 7 (1981) 207. [CrossRef]
- Egerton R.F. and Wang Z.L. , Ultramicroscopy 32 (1990) 137. [CrossRef]
- Egerton R.F. , Ultramicroscopy 28 (1989) 215. [CrossRef]
- Wang Z.L. , J. Electron. Microsc. Technique 14 (1990) 13. [CrossRef]
- Philip J.G. , Whelan M.J. and Egerton R.F. , Proc. 8th Int. Cong. for Electron Microsc (Australian Acad. Sci., Canberra) vol. 1 (1974) p. 276.
- Reimer L. , Proc. XIIth Int. Cong, for Electron Microsc. ( San Francisco Press, 1990) p. 66.
- Tafto J. and Krivanek O.L. , Nucl. Instrum. Methods 194 ( 1982 ) 153. [CrossRef]
- Egerton R.F. , Ultramicroscopy 4 (1979) 169. [CrossRef]
- Egerton R.F. , Proc. 46th Ann. Meet. Elec. Microsc. Soc. Amer. (San Francisco Press, 1988) p. 532.
- Malis T. and Titchmarsh J.M. , in Electron Microscopy and Analysis 1985 ( Institute of Physics, Bristol, 1985 ).
- Ahn C.C. and Rez P. , Ultramicroscopy 17 (1985 ) 105. [CrossRef]
- Weng X. and Rez P. , Ultramicroscopy 25 (1988 ) 345. [CrossRef]
- Trebbia P. and Manoubi T. , Ultramicroscopy 28 (1989) 266. [CrossRef]
- Hofer F. and Golub P. , Micron. Microsc. Acta 19 ( 1988) 73; [CrossRef] Hofer F. , Golub P. and Brunegger A. , Ultramicroscopy 25 (1988 ) 81; [CrossRef] Hofer F. , J. Microsc. 156 (1989) 279.