Free Access
Microsc. Microanal. Microstruct.
Volume 3, Number 2-3, April / June 1992
Page(s) 141 - 157
Microsc. Microanal. Microstruct. 3, 141-157 (1992)
DOI: 10.1051/mmm:0199200302-3014100

Energy-filtering transmission electron microscopy in materials science

Ludwig Reimer, Inge Fromm, Christoph Hülk et Reinhold Rennekamp

Physikalisches Institut, Universität Münster, Wilhelm-Kiemm-Strasse 10, 4400 Münster, Germany

Energy-filtering transmission electron microscopy (EFTEM) with an imaging filter lens can combine the modes of electron spectroscopic imaging (ESI) and electron spectroscopic diffraction (ESD), and different modes can be used to record an electron energy-loss spectrum (EELS). Therefore, an EFTEM can make full use of the elastic and inelastic electron-specimen interactions. This review summarizes the possibilities of EFTEM for applications in materials science.

0778 - Electron, positron, and ion microscopes; electron diffractometers.
0781 - Electron and ion spectrometers.
8170 - Methods of materials testing and analysis.

Key words
TEM -- Energy filtering -- Electron energy loss spectra -- Electron diffraction -- Compton effect -- Monocrystals -- Plasmon dispersion -- Image contrast -- Amorphous state -- Small angle electron scattering -- Polycrystals

© EDP Sciences 1992