Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 2, Number 2-3, April / June 1991
|
|
|---|---|---|
| Page(s) | 203 - 213 | |
| DOI | https://doi.org/10.1051/mmm:0199100202-3020300 | |
Microsc. Microanal. Microstruct. 2, 203-213 (1991)
DOI: 10.1051/mmm:0199100202-3020300
Department of Materials Science and Engineering, State University of New York, Stony Brook, NY 11794, U.S.A.
0781 - Electron and ion spectrometers.
6837L - Transmission electron microscopy (TEM) (including STEM, HRTEM, etc.).
0705K - Data analysis: algorithms and implementation; data management.
Key words
EEL spectroscopy -- Chemical composition -- Yttrium oxides -- Barium oxide -- Copper oxide -- Measurement errors -- Cross sections -- Ionization -- Ionization edge
© EDP Sciences 1991
DOI: 10.1051/mmm:0199100202-3020300
Factors affecting the accuracy of elemental analysis by transmission EELS
Raymond F. EgertonDepartment of Materials Science and Engineering, State University of New York, Stony Brook, NY 11794, U.S.A.
Abstract
The accuracy of elemental analysis by electron energy-loss spectroscopy depends on many factors, such as the concentration of the elements being analysed and the energies of the corresponding ionization edges. We discuss sources of inaccuracy in the acquisition and analysis of spectra, in the quantification procedure and in the required ionization cross sections, together with procedures for minimising these errors.
0781 - Electron and ion spectrometers.
6837L - Transmission electron microscopy (TEM) (including STEM, HRTEM, etc.).
0705K - Data analysis: algorithms and implementation; data management.
Key words
EEL spectroscopy -- Chemical composition -- Yttrium oxides -- Barium oxide -- Copper oxide -- Measurement errors -- Cross sections -- Ionization -- Ionization edge
© EDP Sciences 1991