Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 3, Number 4, August 1992
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Page(s) | 313 - 322 | |
DOI | https://doi.org/10.1051/mmm:0199200304031300 |
References of Microsc. Microanal. Microstruct. 3 313-322
- Stewart R.L. , Phys. Rev. 45 (1934) 488. [CrossRef]
- Fraser H. , Scanning Electr. Microsc. 1 ( 1978) 627.
- Watson J.H.L. , J. Appl. Phys. 18 (1947) 153. [CrossRef]
- Broers A.N. , Cuomo J. , Harper J. , Molsen N. , Laibowitz R. and Pomerants M. , Proc. 9th Intern. Congr. on Electron Microscopy ( Toronto , 1978) Vol. 3, p. 343.
- Pease R.F.W. and Nixon W.C. , Proc. 1st Intern. Conf. Electr. Ion Beam Sci. Tech (1965) p. 220.
- Charalambous P. , Ph. Dr. Thesis, University of London p. 19.
- Behringer U.W. and Vetiger P. , J. Vac. Sci. Technol. 134 (1986) 94.
- Isaacson M. , Langmore J. and Wall J. , Proc. Annl. SEM Symp. ( Chicago, 1974) p. 19.
- Enquist E. and Spetz A. , Thin Solid Films 145 (1986) 99. [CrossRef]
- Ennos A.E. , Brit. J. Appl. Phys. 4 (1953) 101. [CrossRef]
- Martin J.P. , Speidel R. , Optik 36 (1972) 13.
- Egerton R.F. , Electron Energy-Loss Spectroscopy in the Electron Microscope ( Plenum Press, N.Y. , 1986).
- Marks L.D. , Solid State Commun. 43 (1982) 727. [CrossRef]
- Acheche M. , Coluex C. , Kohl H. , Nourtier A. and Trebbia P. , Ultramicroscopy 20 (1986) 99. [CrossRef]
- Isaacson M. , J. Chem. Phys. 56 (1972) 1803. [CrossRef]
- Müller K.H. , Optik 33 (1971) 296.
- Zdanov Gl.S. , Poverchnost Phisika, Chimiya, Mechanika (1983) p. 65.
- Ferrell T.L. and Echenique P.M. , Phys. Rev. Lett. 55 (1985) 1526. [CrossRef] [PubMed]
- Rabinovich V.A. and Havin Z.Y. , Kratkii chimicheskii spra vochnik (Chimiya, Leningrad, 1978) p. 39.
- Batson P.E. , Phys. Rev. Lett. 49 (1982) 936. [CrossRef]
- Sandstrom D.R. , Leck J.H. and Donaldson E.E. , J. Chem . 48 (1968) 5683.