Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 4, Number 2-3, April / June 1993
Page(s) 101 - 110
DOI https://doi.org/10.1051/mmm:0199300402-3010100
References of Microsc. Microanal. Microstruct. 4 101-110
  • Uyeda R., Nonoyama M. and Imura T., Proc. 6th Inter. Congr. EM, 6 (1966) p. 113.
  • Fujita H., ibid., p. 289, and J. Phys. Soc. Jpn. 26 (1969) p. 331.
  • Jouffrey B., Phys. Stat. Soli. (a)55 (1979) 549. [CrossRef]
  • Wilsdorf H.G.F. (on behalf of T. Imura, H. Saka and N. Yukawa) Micron 1 (1969) p. 239; and p. 274.
  • Imura T., Saka H. and Yukawa N., J. Phys. Soc. Jpn. 26 (1969) p. 1327. [CrossRef]
  • Saka H. and Imura T., J. Phys. Soc. Jpn. 32 (1972) pp. 702-718. [CrossRef]
  • Imura T., Electron Microsc. Struct. Mater., G. Thomas et al. Eds., Univ. California Press 5 (1979) pp. 104-132.
  • Butler E.P., Progress Phys. 42 (1979) pp. 833-889. [CrossRef]
  • Kubin L.P. and Martin J.L., Proc. 5th Int. Conf. on the Strength of Metals and Alloys (Aachen, Aug. 27-31, 1979) pp. 1639-1659.
  • Kiritani M., Proc. 5th Int. Conf. on HVEM (Kyoto, 1977) p. 505.
  • Urban K., High Voltage Electron Microsc., P.R. Swann et al. Eds., Academic Press London (1974) p. 356; Microscopie Electronique à Haute Tension, B. Jouffrey Ed., Société Française de Microscopie Electronique (Paris, 1975) p. 159.
  • Martin J.L. and Kubin L.P., Ultra Microsc . 3 (1978) 215; Phys. Stat. Soli.(a)56 (1979) 487. [CrossRef]
  • Imura T. and Fujita H., J. Electron. Microsc. 28 supplement (1979) p. 33.
  • Imura T., Solid State Phys. 4 (1967) p. 208 & Butsuri (1970) p. 815 (in Japanese).
  • Imura T., Saka H., Doi M. and Okamoto N., Jpn. J. Appl. Phys. 10 (1971) p. 654. [CrossRef]
  • Saka H., Todokoro H., Ashikawa M. and Imura T., J. Phys. Soc. Jpn. 31 (1971) p. 1849. [CrossRef]
  • Imura T. and Saka H., Mem. Faculty Eng. Nagoya Unive. 28 (1976) pp. 54-112.
  • Saka H., Noda M. and Imura T., Crys. Latticd Defects 4 (1973) p. 45.
  • Yamamoto A., Saka H., Noda K. and Imura T., Jpn. J. Appl. Phys. 15 (1976) p. 1977. [CrossRef]
  • Imura T., In Situ Experiments with HVEM (Osaka Univ., 1985) pp. 381-397.
  • Hirsch P.B., Electron Microsc. (Leiden P. Brederoo et al. Eds., 1 '1980) p. 146.
  • Imura T., Proc. 11th Int. Congr. Electron Microsc., 2 (1986) pp. 1033-1036.
  • Imura T., Mater. Trans. JIM 32 (1991) pp. 793-806.
  • Kubin L.P. and Louchet F., Philos. Mag . A38 (1978) pp. 205-221.
  • Saka H., Noda K., Imura T., Matsui H. and Kimura H., Philos. Mag. A34 (1976) pp. 33-48. [CrossRef]
  • Louchet F. and Kubin L.P., Scr. Met .9 (1975b) 911. [CrossRef]
  • Ohr J.M., Saka H., Zhu Y. and Imura T., Philos. Mag. A57 (1988) p. 677.
  • Saka H., Sueki Y. and Imura T., Philos. Mag. A37 (1978) p. 273.
  • Hale K.F., Henderson M. and Ishida Y., Proc. 5th Europ. Conf. Electron Microsc (London: The Institute of Physics, 1972) p. 350.
  • Saka H., Kondo N. and Imura T., Philos. Mag. A47 (1983) 857.
  • Saka H., Kondo N. and Kiba N., Philos. Mag. A44 (1981) 1213.
  • Cherns D., Hirsch P.B. and Saka H., Proc. Roy. Soc., A371 (1980) p. 213.
  • Saka H. and Imura T., Proc. 10th Int. Congr. HVEM (Hamburg, 1982) pp. 481-488.
  • Jesser W.A., Nohara A., Nishino Y. and Imura T., Kristall u. Technik. 14 (1979) 1219. [CrossRef]
  • Doi M. and Imura T., Proc. 1st Int. Seminar on Solute Defect Interaction (1986) p. 327.
  • Saka H., Sakai R., Kamino T. and Imura T., Philos. Mag. A52 (1985) p. 29.