Free Access
Microsc. Microanal. Microstruct.
Volume 2, Number 5, October 1991
Page(s) 515 - 530
Microsc. Microanal. Microstruct. 2, 515-530 (1991)
DOI: 10.1051/mmm:0199100205051500

Strategies for determination of inter-atomic distances from extended energy loss fine structure

Mohammad A. Tafreshi, Stefan Csillag, Zou Wei Yuan et Christian Bohm

Institute of Physics, University of Stokholm, Vanadisvägen 9, S-113 46 Stockholm, Sweden

In Extended Energy Loss Fine Structure spectroscopy (EXELFS), modulations occuring on the high energy slope of the ionization edges in electron energy loss spectra are investigated. These modulations supply important structural and chemical information about the local atomic environment of the absorbing atoms. The accuracy and the reproducibility of the results, however, are greatly influenced by the procedures used in the data analysis. In this paper a detailed study of the analyzing method for determination of the interatomic distances is presented. A reliable FFT based deconvolution procedure for extending the method to thick samples is also described.

7920U - Electron energy loss spectroscopy.
7870D - X-ray absorption spectra.

Key words
Interatomic distances -- EXELFS -- Electron energy loss spectra -- Fine structure -- Data analysis -- Deconvolution -- Fast Fourier transforms -- Inner-shell ionization -- Graphite

© EDP Sciences 1991